A team led by Prof. Du Jiangfeng, Prof. Shi Fazhan,
and Prof. Wang Ya from University of Science and Technology of
China, of the Chinese Academy of Sciences, proposed a robust
electrometric method utilizing a continuous dynamic decoupling
technique, where the continuous driving fields provide a
magnetic-field-resistant dressed frame. The study was published in
Physical Review Letters on June 19.
Researchers realize nanoscale electrometry based on
magnetic-field-resistant spin sensors
