A new nanomaterials microscopy approach called Pulsed
Force Kelvin Probe Force Microscopy (PF-KPFM), allows for less than
10 nanometer measurements of work function and surface potential in
a single-pass AFM scan. The findings have been published in two
related articles in ACS Nano and Angewandte Chemie International
Edition.
New microscopy under ambient achieves less than 10 nm
spatial resolution on surface potential measurement
