Researchers at ARCNL have found a way to detect
nanostructures buried under many layers of opaque material using
high-frequency sound waves induced by light. Their findings could
have applications in the semiconductor manufacturing industry, such
as wafer alignment. The researchers also revealed interesting new
phenomena in photo-acoustics that have not been investigated
before. Their results are published in Physical Review Applied.
First author Stephen Edward successfully defended his Ph.D. on this
subject on 18 June at the University of Amsterdam.
