In a new report on Science Advances, Hsinhan Tsai and
a research team in materials, nanotechnology, nuclear engineering
and X-ray science at the Los Alamos National Laboratory and the
Argonne National Laboratory in the U.S. demonstrated a new thin
film X-ray detector prototype. The set up contained highly
crystalline two-dimensional (2-D) Ruddlesden-Popper (RP) phase
layered perovskites and maintained a high diode resistivity of 1012
Ohm.cm, leading to a high X-ray detecting sensitivity of up to
0.276 C Gyair−1 cm−3. To promise revolutionary medical imaging with
minimal health risks. The team collected the signals using the
built-in potential and the results underpin the operation of
existing robust primary photocurrent devices. The detectors
generated substantial X-ray photon-induced open-circuit voltages as
an alternate detecting mechanism. The work suggests a new
generation of X-ray detectors based on low-cost, layered perovskite
thin films for future X-ray imaging technologies.
A robust, sensitive thin-film X-ray detector using 2-D
layered perovskite diodes
